search:atomic force microscope相關網頁資料

      • en.wikipedia.org
        Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times ...
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      • www.nanoscience.com
        Compact, easy to use AFMs including the NaioAFM, FlexAFM, easyScan 2 AFM, & Nanite AFM ... Products Atomic Force Microscopy Scanning Electron Microscopy Atomic Force Microscopy Technology Overview NaioAFM Easyscan 2 AFM FlexAFM
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    日期:2024-04-19
    第 4 章 原子力顯微鏡原理 ( atomic force microscope, AFM ) 由於 STM 侷限於試片的導電性質,使得應用範圍大大的減少,為了能有更廣泛的應用科用,故改用力場作回饋而發展出原子顯微儀( atomic force microscope, AFM ),而因為對導體及絕緣體均有 ......
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    日期:2024-04-18
    NCKU, National Cheng Kung University-Instrument Development Center ... IDC brochure Organization Mission Director Instrument Analysis Division Electrical and Mechanical Division Organization Group leader Technician...
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    日期:2024-04-19
    Atomic Force Microscope 原子力顯微鏡 指導老師:吳坤憲 教授 學生:張正倫 高煜彬 郭奐均 Southern Taiwan University of Technology 原子力顯微術的三種操作模式優缺點 接觸模式之優點: (a) 掃瞄速度較快。 (b) 表面形貌解析度較高,唯一可得到原子 ......
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    日期:2024-04-22
    Atomic force microscopes (AFMs) are a type of microscope. AFMs provide pictures of atoms on or in surfaces. Like the Scanning Electron Microscope (SEM), the purpose of the AFM is to look at objects on the atomic level. In fact, the AFM may be used to look...
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    日期:2024-04-20
    The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit....
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    日期:2024-04-23
    Bruker’s industry-best AFM microscopes & atomic force microscopy technology incorporate the very latest advances in AFM techniques. Learn more today. Atomic Force Microscopy | AFM Microscope Innovation with Integrity Language English German French ......
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    日期:2024-04-19
    ... Butt, H; Cappella, B; Kappl, M (2005). "Force measurements with the atomic force microscope: Technique, interpretation and applications". Surface Science Reports 59: 1–152. Bibcode:2005SurSR..59....1B. doi:10.1016/j.surfrep.2005.08.003. ......