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日期:2024-04-19
2009年2月24日 - ESD是英文Electrical Static Discharge的縮小,中文釋為靜電放電。電荷從一個物體轉移到另一個物體。靜電是一種客觀的自然現象,產生的方式 ......
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日期:2024-04-18
2015 ESD Factory Symposium in Korea June30-July 3,2015 - Conference Center, COEX in Seoul, KOREA 2015 Call For Presentations Submission Deadline- Jan 29, 2015 2015 EOS/ESD Symposium Call For Papers 2015 EOS/ESD Symposium Student Call For ......
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日期:2024-04-23
The ESD Association is a professional voluntary association focusing on the effects and control of static electricity and electrostatic discharge (ESD). The Association is chartered to expand awareness of static electricity and ESD through standards devel...
Dangelmayer Associates, ESD & EOS Consulting Services including S20.20 Programs, Training, Auditing,
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日期:2024-04-22
Dangelmayer Associates offers a full range of customized ESD/EOS (Electrostatic Program Management/Electrical Over Stress) professional consulting services on a Global basis for both product design and manufacturing, including but not limited to Class 0, ...
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日期:2024-04-22
ESD/EOS 6-4 2000 Packaging Databook 6.2.1 How EOS Damages a Component Damage is caused by thermal overstress to a component’s circuitry. The amount of damage caused by EOS depends on the magnitude and duration of electrical transient pulse ......
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日期:2024-04-21
ESD Gun Rentals | 15KV and 30KV models available with various discharge networks including Human Body Model (HBM) for IEC 4-2, Machine Model (MM) for IEC 61340-3-2 , Charge Device Model (CDM), Hand Model, Furniture Model, Mil STD 883, JASO D01-94 ......
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日期:2024-04-22
EOS/ESD ADI Reliability Handbook © 2000 Analog Devices, Inc., Norwood, MA 02062 ALL RIGHTS RESERVED 4 MIL-STD-883 Method 3015 has not been updated since 1989. Subsequently, two very similar test methods were released that more thoroughly ......
EOS versus ESD Misdiagnosis: Charged-Board Events Are a Growing Industry Concern | Medical Electroni
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日期:2024-04-22
Originally Published MEM Fall 2009 ELECTROSTATIC DISCHARGE 70085.tif Figure 1. CDM versus CBE damage (formerly diagnosed as EOS). ... The following investigation provides an example of ICs that were robust to ESD at the component level but were ......