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emuch.netTURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES. TURK J ELECTR ENG CO. 出版周期, Tri-annual. 出版ISSN, 1300-0632.瀏覽：752 -
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IEEE SA - 1232-2010 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test
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1232-2010 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments ( ......
IEEE Xplore Abstract - Optical resonance of nanometer scale bow-tie antenna and bow-tie shaped apert
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Analyze page for Tie. ieee-ies.org - Tie including statistics, performance, general information and densi ......
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