probe card 燒針的相關文章
文化大學機構典藏 CCUR:Item 987654321/21510

文化大學機構典藏 CCUR:Item 987654321/21510

瀏覽:755
日期:2024-05-21
使微探針失去了應有的強度,造成「跪針」;或因,針測過程的電熱效應,而發生「燒針 ... Moreover, since electrothermal effect during probing, the needle tip would bring on a ‘burning needle’. In probe card fabrication, functions of the probe card can ......看更多