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FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2
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日期：2025-06-09
Spectroscopic reflection (190nm-1700nm) of polarized light at multiple angles Spectroscopic ellipsometry with rotating compensator design (300nm-1700nm) Measures film thickness and index of refraction independently Multi-Angle Differential Polarimetry (MA...看更多
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