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Tesec New Products - Tesec Semiconductor Test Systems and Handlers
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日期：2024-06-04
Medium Power Device High Speed Handler 3905-HT Applicable device - D-pak or equivalent Max throughput 25,000 pcs/hr (with 80 ms test time) Cycle time 0.14 sec/pc Test station - max 4 Mark station - 1 Feeding - Frame, stick, Bowl feeder or wafer ......看更多
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