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全智科技 > Wafer Test, Package Test, RF IC Test Capability
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日期：2024-05-30
‧Tester Capability ATE Model RF Ports Frequency Agilent 84000 A120t 12 6 GHz Agilent 84000 A120t 12 3 GHz Agilent ... 12 GHz Credence ASL3000 08 6 GHz Teradyne iFLEX RF 11 6 GHz I2C Integrated ATE Customized 18 GHz / 3 GHz Credence D10 ......看更多
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