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MOS Device Aging Analysis with HSPICE and CustomSim
瀏覽:1034
日期:2026-04-19
MOS Device Aging Analysis with HSPICE and CustomSim 4 Figure 3: The I SUB model of BSIM4 model (A) vs. the HCI impact ionization current model (B). The lines represent the simulated curves, the dots represent the data points. MOSRA Flow MOSRA ......看更多













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