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日期:2025-12-13
The main motive of this experiment is to show, how the non conducting samples
are charged during SEM analysis and how to minimize the charging....
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日期:2025-12-13
單電子電晶體其動作基本原理主要乃應用庫倫電荷效應(Coulomb charging effects)
,其最早被發現是在金屬薄膜內極微小穿透性接合(tunnel junction)中的一種電子 ......
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日期:2025-12-16
Electron charging is the buildup of negative charges on a specimen irradiated
with an electron beam. Charging may occur in a SEM when there is poor
electrical ......
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日期:2025-12-12
Sci Prog. 2004;87(Pt 4):249-68. Utilizing the charging effect in scanning electron
microscopy. Zhang HB(1), Feng RJ, Ura K. Author information: (1)Department of ......
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日期:2025-12-16
14 Jan 2011 ... Charging effect becomes a more serious issue when performing electron beam ...
Here we studied the charging effect using PMMA, PMGI and ......
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日期:2025-12-10
12 May 2014 ... Troubleshooting: edge effect, charging, sample damage. Getting the perfect
image takes knowledge and practice. Obtaining the perfect image ......
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日期:2025-12-11
4 Nov 1970 ... 'Charging' effects in the scanning electron microscope. View the table of contents
for this issue, or go to the journal homepage for more. 1971 J....









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