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![Test Type/Test Parameters: Test Method(s)/Standard(s): Temperature Tests]()
www.siliconcert.com(A2LA Cert. No. 2930.01) 10/11/2013 Page 2 of 3 Test Type/Test Parameters: Test Method(s)/Standard(s): High Temperature Reverse Bias (HTRB) AEC-Q101; JESD22-A108; MIL-STD-750 REV A-E, Method 1042; MIL-STD ...瀏覽：1056
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日期：2025-05-26
RELIABILITY TESTING Condition Application Illustration Moisture Sensitivity Level Soaking (MSL) IPC/JEDEC J-STD-020 JESD22-113 85ºC / 85%RH 85ºC / 60%RH 60ºC / 60%RH 30ºC / 60%RH Other test conditions are available upon request To establish an ......
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日期：2025-05-21
links def abbrev knowledge matrix Introduction - to guide PCB, BGA substrate design layout; Use of underfill- material properties of solder and UBM - control reflow temperature profile - PCB & BGA substrate design layout rules (FEM simulation) - use of un...
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日期：2025-05-23
WWWSKRKSINCCM 7 Test Quantity Standard Endpoints Accept Criteria Dynamic operating life (HTOL) 77/lot JESD22-A108 48 or 168 hours, and 1000 hours 0 fail/77 Preconditioning (PC) 154/lot JESD22-A113 3X reflow 0 fail/154 HAST or unbiased HAST or ......
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日期：2025-05-27
Today, plastic packaged integrated circuits are ubiquitous even for high-reliability applications. Reliability testing and standards play a key role in reliabi… ... Today, plastic packaged integrated circuits are ubiquitous even for high-reliability appli...
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日期：2025-05-25
© C. Glenn Shirley Life of an Integrated Circuit 8/2-4/2011 Plastic Package Reliability 9 Assembly Shipping Storage End-user Environment OEM/ODM Assembly Source: Eric Monroe, 2003 Mobile PC DT User Drop & Vibe Shipping Shock Bend Reflow Handling ......
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日期：2025-05-23
GTSs environmental testing services and list of common standards. ... Environmental Testing is the evaluation of a product in conditions which simulate the physical environments that may harm or adversely affect the products performance....
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日期：2025-05-25
The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 5 of 10 Tech. EPN Code NVCE@25 C NVCE@85 C SS ......
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日期：2025-05-24
Data Retention In this technical note, data retention is defined as retaining a given data pattern for the expected life of a NOR Flash device. Data retention tests evaluate the reliability of the device to withstand a specified number of PROGRAM/ERASE cy...
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