STAr Technologies

STAr Technologies

瀏覽:749
日期:2025-12-09
Memory IC Vertical Probe Card STAr's Aries-Zenith MIP is a new vertical probe card technology for testing memory ICs. Aries-Zenith MIP enables high parallelism memory IC tests at pitch down to 70um and also wafer-level burn-in tests from -40 degC to 200 ....看更多