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STAr Technologies
瀏覽：608
日期：2025-06-21
Memory IC Vertical Probe Card STAr's Aries-Zenith MIP is a new vertical probe card technology for testing memory ICs. Aries-Zenith MIP enables high parallelism memory IC tests at pitch down to 70um and also wafer-level burn-in tests from -40 degC to 200 ....看更多
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