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Control of charging in low-voltage SEM - Joy - 2011 - Scanning - Wiley Online Library
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日期：2025-06-10
Joy, D. C. (1989), Control of charging in low-voltage SEM. Scanning, 11: 1–4. doi: 10.1002/sca.4950110102 ... Charging of the specimen under electron beam irradiation is a common problem in scanning electron microscopy (SEM). It results in unstable imagin...看更多
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